Luphos

Position and rotation of an axle turning lathe

Contactless metrology
of aspheric lenses

High precision and contactless measurement
of the topology of spherical and aspherical optics
with the Luphos MWLI^®-Technology.

The Luphos Multiwavelength-Interferometry
is the new method for
fast, flexible and nanometerprecise metrology
of optical lenses, mirrors and precision components.

The Luphos-Sensor offers:

contactless, fast measurement
nanometer precision
a large and flexible working distance
topology measurement
on polished and rough surfaces
high integrability
multi probe measurement